Facility for Transmission Electron Microscopy and Scanning Electron Microscopy Back

Electron microscopes are instruments for high resolution and high magnification imaging. We have 200kV Transmission Electron Microscope from JEOL, Japan and Scanning Electron Microscope from Hitachi.

The Transmission Electron Microscope mainly used for routine Biological and Nano material TEM studies. System can be operated at various acceleration voltages (80kV, 100kV, 120kV and 200kV). Transmission electron microscope integrated with a Gatan 2K X 2K CCD camera for acquiring high-resolution images.

Scanning Electron Microscope (SEM) is a variable pressure microscope. It can be used for scanning samples, which do not require any preprocessing as well as processed samples after coating with metals. This system is being used to analyze topographical patterns and changes of various samples.

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